WCO classification path
- Chapter90Optical, measuring, medical instruments
- Heading9031Measuring or checking instruments, appliances and machines, not specified or included elsewhere in this chapter; profile projectors
- Subheading903141For inspecting semiconductor wafers, or devices(including integrated circuits) or for inspecting photo-masks or reticules used in manufacturing semiconductor devices(including integrated circuits)
- National9031.41.00For inspecting semiconductor wafers or devices (including integrated circuits) or for inspecting photomasks or reticles used in manufacturing semiconductor devices (including integrated circuits)
9031.41.00
"For inspecting semiconductor wafers or devices (including integrated circuits) or for inspecting photomasks or reticles used in manufacturing semiconductor devices (including integrated circuits)"
HS code 9031.41.00 (Chapter 90 "Optical, measuring, medical instruments"; Heading 9031 "Measuring or checking instruments, appliances and machines, not specified or included elsewhere in this chapter; profile projectors"; Subheading 903141 "For inspecting semiconductor wafers, or devices(including integrated circuits) or for inspecting photo-masks or reticules used in manufacturing semiconductor devices(including integrated circuits)") under the United States tariff schedule classifies "For inspecting semiconductor wafers or devices (including integrated circuits) or for inspecting photomasks or reticles used in manufacturing semiconductor devices (including integrated circuits)". United States customs apply MFN rate of Free, Column 2 rate 50%.
Tariff Schedule
| Classification | Rate |
|---|---|
最惠国税率 (MFN) MFN rate | Free |
第二栏税率 Column 2 rate | 50% |
Global Benchmark
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