United States · Heading· 6 subheadings· 24 codes
9031Measuring or checking instruments, appliances and machines, not specified or included elsewhere in this chapter; profile projectors
Subheadings (6-digit WCO)
903110Machines for balancing mechanical parts [Sno(431) in Ntfn 50-Customs/2017 dated 30.06.2017]→903120Test benches→903141For inspecting semiconductor wafers, or devices(including integrated circuits) or for inspecting photo-masks or reticules used in manufacturing semiconductor devices(including integrated circuits)→903149Other→903180Other instruments, appliances and machines→903190Parts and accessories→
United States tariff lines (10-digit)
All national sub-divisions in United States's tariff schedule
| HS Code | Description | Primary rate |
|---|---|---|
| 9031.10.00.00 | Machines for balancing mechanical parts | Free |
| 9031.20.00.00 | Test benches | 1.7% |
| 9031.41.00 | For inspecting semiconductor wafers or devices (including integrated circuits) or for inspecting photomasks or reticles used in manufacturing semiconductor devices (including integrated circuits) | Free |
| 9031.41.00.20 | For inspecting photomasks or reticles used in manufacturing semiconductor devices | Free |
| 9031.41.00.40 | For wafers | Free |
| 9031.41.00.60 | Other | Free |
| 9031.49.10.00 | Profile projectors | Free |
| 9031.49.40.00 | Coordinate-measuring machines | Free |
| 9031.49.70.00 | For inspecting masks (other than photomasks) used in manufacturing semiconductor devices; for measuring surface particulate contamination on semiconductor devices | Free |
| 9031.49.90.00 | Other | Free |
| 9031.80.40.00 | Electron beam microscopes fitted with equipment specifically designed for the handling and transport of semiconductor wafers or reticles | Free |
| 9031.80.80 | Other | Free |
| 9031.80.80.60 | For testing electrical characteristics | Free |
| 9031.80.80.70 | Other | Free |
| 9031.80.80.85 | Other | Free |
| 9031.90.21.00 | Of profile projectors | Free |
| 9031.90.45.00 | Bases and frames for the coordinate-measuring machines of subheading 9031.49.40 | Free |
| 9031.90.54.00 | Of optical instruments and appliances of subheading 9031.41 or 9031.49.70 | Free |
| 9031.90.59.00 | Other | Free |
| 9031.90.70.00 | Of articles of subheading 9031.80.40 | Free |
| 9031.90.91 | Other | Free |
| 9031.90.91.30 | Of machines for balancing mechanical parts | Free |
| 9031.90.91.60 | Of test benches | Free |
| 9031.90.91.95 | Other | Free |