WCO classification path
- Chapter90Optical, measuring, medical instruments
- Heading9031Measuring or checking instruments, appliances and machines, not specified or included elsewhere in this chapter; profile projectors
- Subheading903149Other
- National90314970For inspecting masks (other than photomasks) used in manufacturing semiconductor devices; for measuring surface particulate contamination on semiconductor devices
90314970
"For inspecting masks (other than photomasks) used in manufacturing semiconductor devices; for measuring surface particulate contamination on semiconductor devices"
HS code 9031.49.70.00 (Chapter 90 "Optical, measuring, medical instruments"; Heading 9031 "Measuring or checking instruments, appliances and machines, not specified or included elsewhere in this chapter; profile projectors"; Subheading 903149 "Other") under the United States tariff schedule classifies "For inspecting masks (other than photomasks) used in manufacturing semiconductor devices; for measuring surface particulate contamination on semiconductor devices". United States customs apply MFN rate of Free, Column 2 rate 50%. Statutory unit of measure: No..
Tariff Schedule
| Classification | Rate |
|---|---|
最惠国税率 (MFN) MFN rate | Free |
第二栏税率 Column 2 rate | 50% |
Global Benchmark
HS-6 prefix 9031.49 across other jurisdictions