WCO classification path
- Chapter90Optical, measuring, medical instruments
- Heading9031Measuring or checking instruments, appliances and machines, not specified or included elsewhere in this chapter; profile projectors
- Subheading903141For inspecting semiconductor wafers, or devices(including integrated circuits) or for inspecting photo-masks or reticules used in manufacturing semiconductor devices(including integrated circuits)
- National9031.41.00.40For wafers
9031.41.00.40
"For wafers"
HS code 9031.41.00.40 (Chapter 90 "Optical, measuring, medical instruments"; Heading 9031 "Measuring or checking instruments, appliances and machines, not specified or included elsewhere in this chapter; profile projectors"; Subheading 903141 "For inspecting semiconductor wafers, or devices(including integrated circuits) or for inspecting photo-masks or reticules used in manufacturing semiconductor devices(including integrated circuits)") under the United States tariff schedule classifies "For wafers". United States customs apply MFN rate of Free, Column 2 rate 50%. Statutory unit of measure: No..
Tariff Schedule
| Classification | Rate |
|---|---|
最惠国税率 (MFN) MFN rate | Free |
第二栏税率 Column 2 rate | 50% |
Global Benchmark
HS-6 prefix 9031.41 across other jurisdictions