90314120

HS code 9031412000 (Chapter 90 "Optical, measuring, medical instruments"; Heading 9031 "Measuring or checking instruments, appliances and machines, not specified or included elsewhere in this chapter; profile projectors"; Subheading 903141 "For inspecting semiconductor wafers, or devices(including integrated circuits) or for inspecting photo-masks or reticules used in manufacturing semiconductor devices(including integrated circuits)") under the Korea tariff schedule classifies "For measuring surface particulate contamination on semiconductor wafers". Korea customs apply MFN rate of 8, WTO bound rate 0. Statutory unit of measure: U/KG. 31 free trade agreement preferential rates are available for this code.