WCO classification path
- Chapter90Optical, measuring, medical instruments
- Heading9031Measuring or checking instruments, appliances and machines, not specified or included elsewhere in this chapter; profile projectors
- Subheading903180Other instruments, appliances and machines
- National90318040Electron beam microscopes fitted with equipment specifically designed for the handling and transport of semiconductor wafers or reticles
90318040
"Electron beam microscopes fitted with equipment specifically designed for the handling and transport of semiconductor wafers or reticles"
HS code 9031.80.40.00 (Chapter 90 "Optical, measuring, medical instruments"; Heading 9031 "Measuring or checking instruments, appliances and machines, not specified or included elsewhere in this chapter; profile projectors"; Subheading 903180 "Other instruments, appliances and machines") under the United States tariff schedule classifies "Electron beam microscopes fitted with equipment specifically designed for the handling and transport of semiconductor wafers or reticles". United States customs apply MFN rate of Free, Column 2 rate 40%. Statutory unit of measure: No..
Tariff Schedule
| Classification | Rate |
|---|---|
最惠国税率 (MFN) MFN rate | Free |
第二栏税率 Column 2 rate | 40% |
Global Benchmark
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