9031.41
章 90光学、测量、医疗仪器
品目 9031未列名测量或检验仪器、器具及机器；轮廓投影仪
子目 903141用于检查半导体晶圆、器件、光掩模或网版
在覆盖的 11 个目的国中，HS 9031.41 的进口主税率美国最低（0%）、巴西最高（12.6%），其中 7 国为零关税。 中国原产经 FTA，6 个目的国可享优惠税率（需持对应原产地证）。
中国视角 · 出口信息
该 HS 前缀下暂无中国税则数据（中国税则尚在接入中）。以下仅显示 12 国进口数据。
落地 12 国 · 进口关税对比
11/12 有数据| 国家 | HS 编码 | 描述 | 主要税率 | 其他税费 | 中国原产 FTA |
|---|---|---|---|---|---|
US美国 | 9031.41.00 | For inspecting semiconductor wafers or devices (including integrated circuits) or for inspecting photomasks or reticles used in manufacturing semiconductor devices (including integrated circuits) | Free | 第二栏税率:50% | 无优惠 |
IN印度 | 90314100 | For inspecting semiconductor wafers, or devices(including integrated circuits) or for inspecting photo-masks or reticules used in manufacturing semiconductor devices(including integrated circuits) | 0 | IGST:18 社会福利附加税:0 综合税负:18 | 无优惠 |
ID印度尼西亚 | 90314100 | - - For inspecting semiconductor wafers or devices (including integrated circuits) or for inspecting photomasks or reticles used in manufacturing semiconductor devices (including integrated circuits) | 0.00 | 增值税 (PPN):12.00 | 0% ACFTA / RCEP · Form E |
MY马来西亚 | 9031410000 | - - For inspecting semiconductor wafers or devices (including integrated circuits) or for inspecting photomasks or reticles used in manufacturing semiconductor devices (including integrated circuits) | 0% | 出口税率:0% 销售税 (SST):10% | 0% ACFTA / RCEP · Form E |
PH菲律宾 | 9031.41.00 | - - For inspecting semiconductor wafers or devices (including integrated circuits) or for inspecting photomasks or reticles used in manufacturing semiconductor devices (including integrated circuits) | 0% | 东盟 (ATIGA):0% 东盟-中国 (ACFTA):0% RCEP:0% | 无优惠 |
TH泰国 | — | — | — | — | |
VN越南 | 90314100 | - - For inspecting semiconductor wafers or devices (including integrated circuits) or for inspecting photomasks or reticles used in manufacturing semiconductor devices (including integrated circuits) | 5 | 优惠税率:0 增值税:8/10 | 0% ACFTA / RCEP · Form E |
JP日本 | 903141000 | For inspecting semiconductor wafers or devices (including integrated circuits) or for inspecting photomasks or reticles used in manufacturing semiconductor devices (including integrated circuits) | Free | WTO 税率:(Free) | 0% RCEP |
KR韩国 | 9031412000 | For measuring surface particulate contamination on semiconductor wafers | 8 | WTO 约束税率:0 | 0% Korea-China FTA / RCEP |
AU澳大利亚 | 90314100 | For inspecting semiconductor wafers or devices (including integrated circuits) or for inspecting photomasks or reticles used in manufacturing semiconductor devices (including integrated circuits) | Free | 0% ChAFTA | |
BR巴西 | 90314100 | Para controle de wafers ou de dispositivos, semicondutores (incluindo os circuitos integrados), ou para controle de fotomáscaras ou retículos utilizados na fabricação de dispositivos semicondutores (incluindo os circuitos integrados) | 12.6% | 工业产品税 (IPI):0.0% | 无优惠 |
MX墨西哥 | 90314101 | Para control de obleas (“wafers”) o dispositivos semiconductores, o control de máscaras o retículas utilizadas en la fabricación de dispositivos semiconductores. | — | 无优惠 |
说明：主要税率为 MFN 最惠国税率。「中国原产 FTA」列 = 中国出口该商品、持对应原产地证（Form E / Form D 等）可享的协定优惠税率，取可解析的最优档；"无优惠"表示该国与中国无适用 FTA 或该编码暂无优惠数据。增值税、消费税等独立征收，完整落地成本请用关税计算器。